Facilities Listing |
| Memory Testing |
- Darkhorse Systems Sigma II dc parametric performed of DRAM devices
- Darkhorse Systems Sigma LC functional testing of DRAM
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| Digital Testing |
- Logue McDonald LMO500 - 384 I/O-100MHz
- Gen Rad 1732M Test Systems dc and parametric measurements
- Logue McDonald 324B-5 Test Systems - dc and parametric measurements along w/propagation delays
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| Linear Testing |
- Analog Devices LTS2020
- Analog Devices LTS2010 - Parametric and functional testing capabilities for linear device such as Op Amps, Comparators, Regulators, DAC's and ADC's
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| Discrete Testing |
- Scientific Test 5150 Test Systems with High Voltage and High Current capability
- Scientific Test 5300 Test Systems with Low Current capability and multiple section DUT scanner deck - ability to record pre and post burn-in measurements - deltas calculated
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| Relay Testing |
- Markenrich RT160 Relay Tester
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| Crystal Testing |
- Saunders & Associates 250A Crystal Test System
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| Passive Testing |
- Gen Rad 1689 RLC Digibridge Test System
- Gen Rad 1687 BLC Digibridge Test System
- Gen Rad 1684 Megohmmeter
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| Programming |
- Digital I/O Unisite Systems - Variety of fixtures for a large assortment of devices
- Data I/O PSX1000 Parallel Programmer-capabilities to program up to 10 devices at a time
- BP Micro BP1400/84
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| UV Erasure |
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| Labeling |
- Brady Printer TMT 200M assortment of labels for all types of packages -- kapton labels for high temperature applications
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| Temperature Testing |
- Temptronics TP04000 Series Thermostream -65C to 200C
- Thermonics T2420SX-7 Temperature Forcing Systems capability of device environment of -65C to 200C
- Thermonics T-2820 Precision Temperature Forcing System -65C to 200C
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| Burn-In Capabilities |
- Liner
- Digital
- Discrete
- Despatch PBC2-16
- Blue M
- Capability to perform static on a variety of packages from standard diodes to complex BGA. Dynamic performed at customer request
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| Temperature Cycling Air To Air |
- Blue M WSP 109B3X16 capable of automatic transfer to satisfy MIL-STD-883 Method 1010 and MIL-STD-750 Method 1051
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| Gross Leak Testing |
- Trio-Tech 481 Test Systems
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| Particle Impact Noise Detection (PIND) |
- Dunegan/Endevco 4501A capability to satisfy MIL-STD-883 Method 2020 and MIL-STD-750 Method 2052
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|
Testing Services |
| Quality Compliance |
- ISO 9001:2000 MIL-I-45208
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| Equivalent Testing To |
- MIL-M-38510
- MIL-PRF-38535
- MIL-PRF-19500
- MIL-STD-202
- MIL-STD-750
- MIL-STD-883
- MIL-STD-981
- MIL-HDBK-454
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| Electrical Testing/Burn-In |
DRA has an extensive test program library with capabilities for AC, DC parametric and functional evaluation and testing of a wide variety of devices ranging from diodes and transistors to more complex linear, LSI, VLSI technologies, as well as complete bench test set-ups for non-standard parameters and passive components. Static/Dynamic Burn-In with positions are available for most package styles.
- UP SCREENING - INDUSTRIAL TEMPERATURE
- AC PARAMETRICS
- BURN-IN
- LIFE TESTING
- READ & RECORD
- GO/NO-GO
- PRE & POST ELECTRICAL
- MEMORY TESTING
- COMPARATIVE ANALYSIS
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| Environmental Testing |
- SOLDERABILITY/TINNING
- STABILIZATION BAKE
- HUMIDITY TESTING
- TEMPERATURE CYCLE
- CENTRIFUGE
- HERMETICITY (FINE/GROSS LEAK)
- PARTICLE IMPACT NOISE DETECTION (PIND)
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| Custom Services |
- DEVICE PROGRAMMING & ERASURE
- MARKING
- BAR CODING
- DPA/FAILURE ANALYSIS
- SELECTION TESTING
- ENGINEERING EVALUATION
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